Journal Article

• EEG/MEG Source Imaging in the Absence of Subject’s Brain MRI scan: Perspective on Co-registration and MRI Selection Approach International Journal of Imaging Systems and Technology 07 Jul. 2022. doi: 10.1002/ima.22786.
• HML-RF: Hybrid Multi-Label Random Forest IEEE Access, IEEE vol. 10 pp. 22902-22914 24 Feb. 2022 doi:10.1109/ACCESS.2022.3154420.
• Low Complexity Optimal and Suboptimal Detection at Spatial Modulation MIMO Receivers  IEEE Transactions on Vehicular Technology, Institute of Electrical and Electronics Engineers Inc.2022 doi: 10.1109/TVT.2022.3141520.
• Human Activity Recognition Algorithm in Video Sequences Based on Integration of Magnitude and Orientation Information of Optical Flow International Journal of Image and Graphics, World Scientific Publishing vol. 22, no. 1 Jan. 2022 doi: 10.1007/s11042-021-11313-0.
• Background Knowledge Attacks in Privacy-Preserving Data Publishing Models, Computers & Security, Elsevier 12 Aug. 2022, doi:10.1016/j.cose.2022.102874.[In Press, Journal Pre-proof]
• Ahlad Kumar, Riya Saini, Mayank Patel and Vinay S Palaparthy Improved Estimation of Leaf Wetness Duration using Deep Learning based Time-Resolution Technique IEEE Sensors Journal, IEEE, , ISSN: 1558-1748, 11 Nov. 2022, pp. 1-10 DOI: 10.1109/JSEN.2022.3220712
  
• Music footprint recognition via sentiment identity and setting identification Multimedia Tools and Applications, IEEE 02 Jan. 2022. doi: 10.1007/s11042-021-11430-w.
• Bhrugu Dave, Sarthak Patel, Rishi Shivani, Shishir Purohit, and Bhaskar Chaudhury Synthetic data generation using generative adversarial network for tokamak plasma current quench experiments Contributions to Plasma Physics, John Wiley and Sons, , ISSN: 1521-3986, 02 Dec. 2022 DOI: 10.1002/ctpp.202200051
  
• Twinkle Bhavsar, and Abhishek Jindal On Reducing the Outage Probability in VFD-NOMA with Limited CSI at Source IEEE Communications Letters, IEEE, , ISSN: 1558-2558, 06 Dec. 2022, pp. 1-5 DOI: 10.1109/LCOMM.2022.3227129
  
• Determining asynchronous test equivalence for probabilistic processes Information Processing Letters Elsevier  vol. 177 ISSN 0020-0190 Aug. 2022 106269 10.1016/j.ipl.2022.106269