displayNone
banner

A Comparative Study of MOSFET (Single and Double Gate) Silicon Nanowire FET and CNTFET by Varying the Oxide Thickness

Type
Books Chapters
Author
Hardiki Mukesh Devre
Mayank Kumar Jethwa
Yash Agrawal and Rutu Parekh
DOI
doi: 10.1007/978-981-16-0275-7_17
Year
ISBN
ISBN: 9789811602757.
Publication details
in Proceeding of Fifth International Conference on Microelectronics, Computing and Communication Systems, Ranchi, India, Lecture Notes in Electrical Engineering, vol 748., Nath V., Mandal J.K. (eds), Springer, Singapore. pp. 205-216
From Year
2009
To Year
2009
To Date
All year
Back to Top