Conference Papers

• Mekala Girish Kumar, Rutu Parekh, Takshashila Pathade, Yash Agrawal Effective Low Power ALU Design with Incorporation of MWCNTB On-chip Interconnects IEEE 24th Electronics Packaging Technology Conference (EPTC 2022), Singapore, Singapore, IEEE, 07-09 Dec. 2022, pp. 371-377
  
  10.1109/EPTC56328.2022.10013187
  
• Mekala Girish Kumar, Vobulapuram Ramesh Kumar, Yash Agrawal Process variations in dielectric inserted side contact multilayer graphene nanoribbon interconnects using montecarlo simulations IEEE 24th Electronics Packaging Technology Conference (EPTC 2022), Singapore, Singapore, IEEE, 07-09 Dec. 2022, pp. 252-255
  
  10.1109/EPTC56328.2022.10013293
  
• Ashok Kumar Das Shubham Chandra, Sanjay Srivastava, and Anil Roy, "Public Toilet Hygiene Monitoring and Reporting System," In: 2018 IEEE SENSORS, New Delhi, India, 28-31 Oct. 2018, pp. 1-4. Doi: 10.1109/ICSENS.2018.8589894
• Hiren Madhu, Prasenjit Majumder, Sandip J. Modha, Shrey Satapara, Thomas Mandl Overview of the HASOC Subtrack at FIRE 2021: Conversational Hate Speech Detection in Code-mixed language Forum for Information Retrieval Evaluation, CEUR Workshop Proceedings, Virtual Event, India, 13-17 Dec. 2021, pp. 1-12
  
  
• Ashok Kumar Das Madhumita Mazumdar, "Reflecting on Chemical Education: Nilratan Dhar andthe Legacy of P C Ray," Indian Journal of History of Science, vol 53, no. 4, 2018, pp. T94-T99. Doi: 10.16943/ijhs/2018/v53i4/49531
• Eduard Paul Enoiu, Kumar Iyer, Saurabh Tiwari Combining Model-Based Testing and Automated Analysis of Behavioural Models using GraphWalker and UPPAAL 29th Asia-Pacific Software Engineering Conference (APSEC 2022), Japan, IEEE, 06-09 Dec. 2022, pp. 452-456
  
  10.1109/APSEC57359.2022.00061
  
• Tushar Gadhiya, Anil K. Roy, "Optimized Wishart Network for an Efficient Classification of Multifrequency PolSAR Data," IEEE Geoscience and Remote Sensing Letters, Vol. 15, no. 11, pp. 1720 - 1724, IEEE, Nov. 2018. Doi: 10.1109/LGRS.2018.2861081
• Avik Hati, Kishankumar Vaishnani Bakul Gohel Impact of Stain Normalisation Technique on Deep Learning based Nuclei Segmentation in Histopathological Image International Conference on Advances in Intelligent Computing and Applications (AICAPS 2023), Kochi, India, IEEE, 01-03 Feb. 2023, pp. 1-4
  
  10.1109/AICAPS57044.2023.10074363
  
• Ruchi Gajjar, Tanish Zaveri, Asim Banerjee, and K.V.V. Murthy, "Trigonometry-based motion blur parameter estimation algorithm," International of Journal of Image Mining, Vol. 3, No. 1, pp. 67-78, Jun. 2018. doi: 10.1504/IJIM.2018.092997
• Abhishek Yadav, Mayank Kumar, Priyanka Singh, Shaifu Gupta On Robustness of Split Neural Networks Against Data Poisoning Attacks International Joint Conference on Neural Networks (IJCNN 2023), Gold Coast, Australia, IEEE, 18-22 Jul. 2023, pp. 1-8