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IEEE Transactions on Industrial Electronics, vol. 54, no. 1 pp. 559-566 Feb. 2007.
Jonathan P, Kalpesh and Bowen, Kapoor Test conditions for fault classes in Boolean specifications
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Hemangee K., Josephs Mark B, Kapoor Controllable Delay-Insensitive Processes
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Ashutosh and Phatak, Das Manik Lal, Saxena Proxy signature scheme with effective revocation using bilinear pairings
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Gangishetti Raju, Gorantla M. Choudary Threshold key issuing in identity-based cryptosystems
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Ghodgaonkar Deepak K., Wui Wong Tin Microwave non-destructive testing technique for characterization of HPMC-PEG 3000 films
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Anuar Nor Khaizan, Wui Wong Tin Characterization of hydroxypropylmethylcellulose films using microwave non-destructive testing techn...
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Chaudhuri, Gangishetti Raju, Gorantla M. Choudary Identity based multisignatures
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Ashutosh, Das Manik Lal, Saxena A Novel remote user authentication scheme using Bilinear Pairings
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